ECE1388 VLSI Design Methodology: Final Project

 

4 MHz DC-DC Converter with Low Power Current Sensor

 

 

 

 

 

 

 

Date of Submission: December 24, 2009

 

 

 

 

 

 

 

 

 

 

 

 

Members:

1. S M Ahsanuzzaman (Ahsan)

2. Seyed Behzad Mahdavikhah Mehrabad

3. Peng Zhao

 

 

 

 

 

 

 

 

Project Objective

            The objective of this project is to design and implement a fully integrated DC-DC converter with low power current sensor. DC-DC converters are widely used to supply power to all sorts of modern electronic devices; such as computers, LCD monitors, cell phones, mp3 players, digital cameras etc. Fully integrated DC-DC converters are very popular in low power portable electronic devices due to its very high efficiency and small package size. A current sensor is often included in the design for certain advantages such as: inherent current protection, simplified control approach etc [1]. One of the major challenges of the current sensor based approach is that it reduces the overall efficiency of the system by introducing additional losses.  In this project a low power current sensor approach is taken to implement a fully integrated DC-DC converter.

 

Design Overview and Specifications

The block diagram of Fig. 1 shows different modules of a DC-DC converter. Due to the big value of inductor and capacitor (in the order of µ), these components would be off chip and the rest of the converter would be on chip. In Fig. 1, the blocks that are implemented in this project are marked with the rectangle called ‘Integrated Chip’. This includes power MOSFETS (both NMOS and PMOS), gate drivers, current sense circuit, comparator, SR latch, dead-time. The controller is left for future development. In the close loop system the current sensor extracts the information about the converter current (isense). Similarly the controller senses the output voltage to generate the current reference (iref). These two currents are then compared using an analog comparator and the output of the comparator resets the SR latch. The dead-time generator module generates the gating signals for the power MOSFETS based on the output of the comparator. Therefore, the chip will receive the source input voltage (3.3V), the sample of the converter output voltage as the input voltage to the on chip digital controller (named Vin in our chip) and a 1.5V input as the operating voltage for our controller circuitry. Finally the output pin (named Vx in our design) would be connected to the off chip inductor.

            In this project, the power mosfets, gate drivers and input capacitor have been done by Ahsan,

Behzad did the Amplifier, dead time and pad design. Current sensor and comparator are done by Peng.

 

Fig. 2 depicts the full layout of our chip.

The following table summarizes the specification for our proposed project:

 

Output Power

400 mW

Output Voltage

1.2 V

Input Voltage

2.7 V – 3.3 V

Switching Frequency

4 MHz

Process

0.13 micron

Table 1. Project Specifications

 

Block Design

 

1. Power MOSFETs:     Generally in a buck converter we need two MOSFETs known as main switch and synchronous rectifier. These two MOSFETs work in either triode or cut off region when the switch is on or off. To minimize Ron, each of them is comprised by many MOSFETs, in our case 300 unit sized (w=60µ) thick oxide NMOS for synchronous rectifiers and 900 PMOS for main switches. In spite of loss reduction in switches during conduction the large number of MOSFETs in parallel would have a large Cg, resulting in more switching losses, which is more significant for small load currents. In our design to compromise between conduction losses and switching losses, each of the two switches is divided into 15 segments of parallel MOSFETs, therefore depending on the load current; the controller determines how many of the segments take part in current conduction. Fig. 3 illustrates the layout of the power MOSFETs

 2. Gate Drivers:        According to big value of Cg of the switches, driving the MOSFETs directly with the output of the dead time circuit introduces a delay associated with charging the gate capacitor. The gate driver block consists of four inverters with appropriate sizing in series. Hence, it both decouples the power switches from the dead time circuit and drives the gate of the power switches with lower delay time. Fig. 4 illustrates the layout of the Gate drivers.

3. Current Sensor:    The current sensor is used to find the current passing through the main power switches, the PMOS. To do this, we sense the voltage drop across the PMOS, then by amplifying and inverting this value the current is found. The current sensor in our design is composed of a sense-FET and a high pass filter. The sense-FET is basically two transistors in series which is in parallel with the PMOS. This sense-FET is followed by an RC high pass filter. Therefore, the sense-FET brings a portion of the voltage drop across the main switches to the high pass filter and the filter removes the DC value of its input and passes it to the amplifier. Fig. 5 illustrates the layout of the Current sensor.

4. Amplifier:  A telescopic cascade amplifier is used to invert and amplify the voltage drop across the main switches. This equals the current passing through the PMOS multiplied by a gain. The schematic and layout of the current sensor circuit are depicted in Fig. 6 and Fig. 7

5. Comparator:          The comparator has two parts, a pre amplifier followed by the comparator [2]. It performs the comparison between the output of the current sensing circuitry and the reference current coming from the digital controller.  The schematic of the comparator circuit is depicted in Fig. 6. Fig. 8 illustrates the layout of the comparator followed by an SR latch.

6. Dead Time Generator:     To minimize losses during switching, a programmable dead time generator has been used which is capable of generating 16 levels of delay between one and five nano seconds. This delay is generated using an SR latch with programmable delay line generators in its feedback connection [3] as in Fig. 9. The programmable delay generators consist of a current starved delay generation circuit followed by a 4:1 multiplexer, whose schematics are depicted in Fig. 10 and Fig. 11 respectively. Fig. 12, Fig. 13 and Fig. 14 illustrate the layout of the dead time generator, the 4:1 multiplexer and the current starved delay generation circuit.

7. Input Capacitor:      A 100 fF capacitor is placed between the ‘VDD’ and ‘GND’ inputs to eliminate the AC noises on the input from the outside world. Fig. 15 illustrates the layout of the Input capacitor. This

 

PAD Design:   Two different types of pads have been used in our design, one for analog inputs and outputs and the other for the digital inputs and outputs. The difference is that the pads used for digital pins are utilizing buffers. Moreover all these pads are protected from electrostatic discharge (ESD). Fig. 16, Fig. 17 and Fig. 18 show the schematics of an input digital pad, the ESD circuit and the input buffer. Fig. 19 illustrates the layout of a digital buffered input pad, including the bond pad, ESD and buffer; the digital output pads look similar. The analog input and output pads would look the same, but excluding the buffer.

In the layout, a guard ring is utilized to remove noise and the influence of different elements in the design, also the digital and analog and power switch (relatively high frequency of high current switching) circuitries have been shielded to isolate them from noises.

 

Appendix A (LVS Report): Follow the link: LVS Report

Appendix B (DRC Report): Follow the link: DRC Report

Moreover an screenshot of the error free DRC Error layer window can be found here.

Appendix C (Simulation Result): Follow the link: Top Level Simulation

 

 

 

References:

1-      Olivier Trescases, Integrated Power-Supplies for Portable Applications, PhD thesis, Department of Electrical and Computer Engineering, University of Toronto, 2007.

 

2-      Baker, R. J. 2002 Cmos: Mixed-Signal Circuit Design. John Wiley & Sons, Inc.

3-      Maymandi-Nejad, M. and Sachdev, M. 2003. A digitally programmable delay element: design and analysis. IEEE Trans. Very Large   Scale Integr. Syst. 11, 5 (Oct. 2003), 871-878. DOI= http://dx.doi.org/10.1109/TVLSI.2003.810787.